Prof. Duncan M. (Hank) Walker is a world authority on VLSI test and yield modeling. He is Associate Dean for Graduate Studies, College of Engineering, and professor at the Department of Computer Science at Texas A&M University. Prof. Walker has also been Ford Motor Company Design Professor II and Department Head, Department of Computer Science and Engineering, Texas A&M University, 2011-2013. He has been a recipient of various awards and prestigious accolades such as the ACM Distinguished Scientist, 2014; Charles W. Crawford Service Award, 2009-2010; E. D. Brockett Professorship, 2007-2008; and Lockheed Martin Aeronautics Company Excellence in Engineering Teaching Award, 2006. He has been an AMD Fellow and Texas A&M Engineering Experiment Station Fellow. Prof. Walker has occupied leading positions in numerous professional societies and activities such as the Program Committee, Design Automation and Test in Europe Conference, 2018-present; Steering Committee, IEEE Texas Workshop on Integrated System Exploration, 2013-present; Steering Committee, IEEE International Workshop on Defect and Adaptive Test Analysis (DATA), 2004-present; Associate Editor, IEEE Transactions on Computer-Aided Design of Circuits and Systems, 2010-2011; Vice-General Chair, IEEE International Workshop on Defect Based Testing, 2006; Program Committee, IEEE International Conference on Computer Aided Design, 2003-2005. His research interests include defect-based test, realistic fault modeling, IDDQ test, delay test, defect diagnosis and yield modeling. Prof. Walker had authored scores of publications and research articles in top ranking VLSI testing, semiconductor manufacturing journals and conference proceedings. Prof. Walker has a BS in engineering from the California Institute of Technology, and an MS and a PhD in computer science from Carnegie Mellon University. He is a member of the IEEE and ACM.